-C01

13 Sep 2018 goofy.liu

1.Engineer Mode ICC Loop test Update.

When Loop Item checked, only get ATR command being issued in a infinite loop until stop.

2. Supported Products List:

VP3310, VP5300, VP6300, VP8800

-C02

09 Feb 2018  goofy.liu

Platform: NEO 2.0

1.[Tamper Test]

Added Ability to detect UUT rebooting over USB Device check routine.

Note: Must set up UUT

(a) with RS232 & USB-HID Connectivities on the same time.

(b) Use RS232 Connection.

2.Add skip 04-09 behavior in

[Connecting]

[ICC]

[MSR]

-C01

01 Feb 2018 goofy.liu

1.Update Loop Test Flow.

Enable [Cancel] @ Waiting Interval.

2.Add Skip Internal Loop @ HW Area.

This feature skips internel loop while loop test check box 'ON'.

-C03

31 Jan 2018 goofy.liu

1.+Battery Tamper Detection

2.+Removal Sensor Test.

3.Update Tamper List Info.

31 Jan 2018 

Verified FW: VP6300 FW v1.00.000.0054.S

-C01

2017 Dec 13 Released, goofy_liu

1.Fixed LEDs+Buzzer Test issue.

2.Test MSR Interface in UMFG mode.

3.Right-Clicking FWInfo to pop-up Voltage Level Selection Menu.

Area 1, Right Clicking  → Area 2, Pop-up Menu.

-C03.b

17 Jan 2018 goofy.liu

1.Update for Tamper Display w/ Date-Time if UUT being Tampered.

2.Default Loop Item Duration

1500 ms --> 100000 ms

3.ICC Test @ VP5300 @VP6300,

Skip Front Sensor IN/OUT Test Steps

-C02

V1.00.005-C02, 23 Nov 2017 

1.Fixed ICC Test, Test Scenario Problem @ VP6300

2.Fixed , Tamper Test, Test Scenario

-C01

V1.00.005-C01, 23 Nov 2017 

1.Update Tamper Test Scenario. More Repower Times.

---<UMFG ↔ SMFG Notes>--

1.Please use USDK-PKI to perform UMFG + SMFG function.

a.USDK_PKI Link

b.or I used USDK_PKI version :USDK_PKI_10_17.7z

Operation Note :

2.

2.a. UMFG → SMFG , Steps Sequence : 1-2-3-4-5, Check twin successfully message in right-most message window.

2.b SMFG → UMFG

Steps Sequence: 1-2-3, Check Master Reset Command Done message.

V 1.00.004

-C02

-C01

-C04

-C03

-C02

2017 Oct 06 updated

• 1.All Conn: Tampers Test Sometimes Failed in Get Status.

Sometimes Rebooting after Status Get.

FW Issue.

=========================================

V1.00.003-C02, 2017 Oct 06

• 1.+) TM810 - Left-Click : 3-in-1 Test, Hardware Mode Only

L100 Ping --> Ethernet Ping --> Poll For Token

• 2.+) TM810 - Right-Click :

Pop-up Menu Selection of EMV L1

  - Voltage Level Selection.

    Group 1 + 2

• 3.LED+Buzzer Test Improvement

   RFID Panel LED light on in order(L->R).

• 4.[FW Fixed]

  USB Conn: ICC Test - Front Switch Doesn't work.

• 5.[FW Fixed]

  USB Conn: RFID Test - 2C-02 Doesn't work.

• 6.Sleep Mode - Remove All Cmds Except Sleep On Cmd

• 7.Stop Mode - Remove All Cmds Except Stop On Cmd

-C01

-C01

1.Add Tamper List Display (Dialog Box)

2.For ME Tamper Test.

a.如果要循環連續測試, 請把 項目3.選起, TS 會自動連續測.

Please check *Single Loop Test"  (part 3) for loop test purpose.

b.對話視窗 5. 在測試過程會持續更新. 直到項目 3 取消選取或測試成功

Tamper List Dialog box (part 5). Loop Test Running until un-check part 3.

紅色背景or字 = Tamper Broken, 綠色背景or字 = Tamper Good

Red Background or String = Tamper Broken, Green Background or String = Tamper Good

-C04

2017 July 17 Released,for ESD version

• Update Poll For Token and Get ATR Commands, depending on NEO 2.0 IDG-Rev111
• Ask Cypress FW Team "David Dai" to support ESD commands.

-C03

-C02

Kevin Chang (Deactivated)

2017 July 05

-C01

-C04

Tony Huang

2017 Feb 15