SW_Hardware_Utilities


Platform NEO 2.0 + K81

Lab Debug Tool: USB-IF, EMI

Projects: Vendi Pro (Fox Tail); Spectrum Pro II;

VersionCommentApproved by...

V 1.00.008



 goofy.liu

1.Engineer Mode ICC Loop test Update.

When Loop Item checked, only get ATR command being issued in a infinite loop until stop.

2. Supported Products List:

VP3310, VP5300, VP6300, VP8800


V 1.00.007



  goofy.liu


Platform: NEO 2.0

1.[Tamper Test]

Added Ability to detect UUT rebooting over USB Device check routine.

Note: Must set up UUT

(a) with RS232 & USB-HID Connectivities on the same time.

(b) Use RS232 Connection.

 

2.Add skip 04-09 behavior in

[Connecting]

[ICC]

[MSR]


 goofy.liu

1.Update Loop Test Flow.

Enable [Cancel] @ Waiting Interval.


2.Add Skip Internal Loop @ HW Area.

This feature skips internel loop while loop test check box 'ON'.


V 1.00.006



 goofy.liu

1.+Battery Tamper Detection

2.+Removal Sensor Test.

3.Update Tamper List Info.

 

Verified FW: VP6300 FW v1.00.000.0054.S

2017 Dec 13 Released, goofy_liu

1.Fixed LEDs+Buzzer Test issue.

2.Test MSR Interface in UMFG mode.

3.Right-Clicking FWInfo to pop-up Voltage Level Selection Menu.

Area 1, Right Clicking  → Area 2, Pop-up Menu.


V 1.00.005



 goofy.liu

1.Update for Tamper Display w/ Date-Time if UUT being Tampered.

2.Default Loop Item Duration

1500 ms --> 100000 ms

3.ICC Test @ VP5300 @VP6300,

Skip Front Sensor IN/OUT Test Steps


V1.00.005-C02,  

1.Fixed ICC Test, Test Scenario Problem @ VP6300

2.Fixed , Tamper Test, Test Scenario


V1.00.005-C01,  

1.Update Tamper Test Scenario. More Repower Times.

---<UMFG ↔ SMFG Notes>--

1.Please use USDK-PKI to perform UMFG + SMFG function.

a.USDK_PKI Link

b.or I used USDK_PKI version :USDK_PKI_10_17.7z

Operation Note :

2.

2.a. UMFG → SMFG , Steps Sequence : 1-2-3-4-5, Check twin successfully message in right-most message window.

2.b SMFG → UMFG

Steps Sequence: 1-2-3, Check Master Reset Command Done message.


V 1.00.004



V1.00.004-C02, 2017 Nov 16

Project:VP5300

1.For Maguel Caro MSR Repeat Test.


V1.00.003-C04, 2017 Oct 24

Project:VP5300

1.Update ICC Test

  Add Front-Switch + Card-Seat Status Check before Get ATR.

2.Update SAM Test

  Add Get SAM ATR Error-Retry Mechanism (3 times up)

  since Tri-Mag 4 talks slower response.


V 1.00.003



2017 Oct 17

1.MSR Test Function Ready

2.RFID Test Function Ready

3.ICC Test Function Ready

4.LED+Buzzer Function Ready


V1.00.003-C03, 2017 Oct 13

  • 1.Stop Mode -

*changed parameter ..

old : Turn On Stop Mode (Byte 1, Byte 1)

new : Turn On Stop Mode (Byte 1, Byte 0) - 2017 Oct 12 updated

*remove confirm dialog box

Sleep Mode -

*remove confirm dialog box

  • 2.Update 3-in-1 test

CL RFID

old: Poll for token,

new: Loopback start / stop

  • 3.Checking Battery Issue.

a) Set RTC -->

b) USB-HID Test, Ask User Re-Power on again -->

c) Check RTC

If Failed in Step (c), then show "Please check Battery Status."


2017 Oct 06 updated

  • 1.All Conn: Tampers Test Sometimes Failed in Get Status.

Sometimes Rebooting after Status Get.

FW Issue.


=========================================

V1.00.003-C02, 2017 Oct 06

  • 1.+) TM810 - Left-Click : 3-in-1 Test, Hardware Mode Only

L100 Ping --> Ethernet Ping --> Poll For Token

  • 2.+) TM810 - Right-Click :

Pop-up Menu Selection of EMV L1

  - Voltage Level Selection.

    Group 1 + 2

  • 3.LED+Buzzer Test Improvement

   RFID Panel LED light on in order(L->R).

  • 4.[FW Fixed]

  USB Conn: ICC Test - Front Switch Doesn't work.

  • 5.[FW Fixed]

  USB Conn: RFID Test - 2C-02 Doesn't work.

  • 6.Sleep Mode - Remove All Cmds Except Sleep On Cmd
  • 7.Stop Mode - Remove All Cmds Except Stop On Cmd

--<ToDo>--

2017 Sept 28 updated

  • 1)USB Conn: ICC Test - Front Switch Doesn't work
  • 2)USB Conn: RFID Test - 2C-02 Doesn't work
  • 3)All Conn: Tampers Test Failed in Get Status.

=========================================

V1.00.003-C01, 2017 Sept 28

  • 1.Test Item: L100, SAM, LED+Buzzer, MSR, Contactless,

  Contact, Sleep Mode, Stop Mode, and Ethernet.


V 1.00.002



1.Add Tamper List Display (Dialog Box)

2.For ME Tamper Test.

a.如果要循環連續測試, 請把 項目3.選起, TS 會自動連續測.

Please check *Single Loop Test"  (part 3) for loop test purpose.

b.對話視窗 5. 在測試過程會持續更新. 直到項目 3 取消選取或測試成功

Tamper List Dialog box (part 5). Loop Test Running until un-check part 3.

紅色背景or字 = Tamper Broken, 綠色背景or字 = Tamper Good

Red Background or String = Tamper Broken, Green Background or String = Tamper Good



V 1.00.001



2017 July 17 Released,for ESD version

  • Update Poll For Token and Get ATR Commands, depending on NEO 2.0 IDG-Rev111
  • Ask Cypress FW Team "David Dai" to support ESD commands.

  • Unification of HW Function Controls in <HW Area> Panel
  • Carrier On/Off by Checked / Unchecked Box
  • Ping Command in Loop. Also check Carrier Box to Turn ON/OFF Carrier

Under construction...


  • Add Carrier ON, Ping, Carrier OFF Function (Button)
  • Modify <Eng Mode Page>→<NEO Area Page>→ Act Txn 02-40 functions.
  • Supporting Act Txn (02-40) Test
  • Loop Test.
  • USB-HID Interface, NGA Protocol

Platform AR 3.0.0

Lab Debug Tool: USB-IF, EMI

Projects: PISCES

VersionCommentApproved by

V 1.00.001



For USB-IF, EMI Test.

Tony Huang

2017 Feb 15