005 - Platform : Android



Test Process Flow in Manufactures.



Products List

ProductYearTSComment

AP6800

2022TS200, K81 Only



  • Dual MCU System

Android : A300

NEO3x : K81






K81 Functions Docklight,

powered by Paul Zhang 

VersionDateComment

 

K81 Functional Test Script.

Platform: NEO2x




Simple User Guide

ItemComment

UI

Mode 1

Press "Start" Button to Start Test Automatically.

Mode 2

Single Test Item Test. Just Click test item button as you like.

TS200 DL Link, AP6800, For K81 Only

VersionDateCommentSQA

V 3.2.1.2




 

goofy.liu 

1.Update Tamper Enable

    current: 90-02,      timeout: 15 secs

    new: 90-13 + 16000F, tout: 120 secs


 

goofy.liu 

1.Fixed FWInfo Item @ Board Level Test

    Production ID 

      0x7 --> 0x5

      

2.Fixed K81 LED Test Items Issue  @ Board Level Test

  Updated IDG commands 90-13 serials.


3. UMFG Tamper Enable Timeout  updated

  native: 40000 ms, 40 seconds

  new: 120000 ms,120 seconds


 

goofy.liu 

1.Fixed FWInfo Item @ Assembly Level Test
    Production ID 
      0x7 --> 0x5
      
2.Fixed K81 LED Test Items Issue@ Assembly Level Test
  Updated IDG commands 90-13 serials.

3.Fixed Printer Test Items Issue@ Assembly Level Test
  Updated IDG commands 90-13 serials.
  

==[Dev Note]==

FW @Casper Provided the corrected Commands.
  Neo 3 IDG command supplement for Redwood (002).docx



V 3.2.1.1




 

  • 1. Button Cell Voltage Range Correction

 Native: 3.0V ~ 3.4V, incorrect

 New:    2.85V~ 3.15V, based on 3V +- 5%



 

  • ====================
    2022 Jan 21. Goofy.Liu
    V3.2.1.1-C05
    1.Touch Test 
      - In
  • ====================
    2022 Jan 20. Goofy.Liu
    V3.2.1.1-C04
    1.Tamper Test Updated
      - Removed Device Reset 90-00 after Get DRS (C7-3A)
    Prevented from the Tamper Disable Function.
  • ====================
    2022 Jan 20. Goofy.Liu
    V3.2.1.1-C03
    1. Updated Jig1 Arduino Test Scenaio

Note: There is the Arduino Command Gap between AP6800 and NEO3x

AP6800 = "VDC_IN = 8.83\r\n"
NOE3x  = " VDC_IN = 8.83\r\n"

  • ====================
    2022 Jan 17. Goofy.Liu
    V3.2.1.1-C01
    1.Initial Version
       - Board Level, Jig 1 Test
       - Board Level, Jig 2 Test
       - Assembly Level, Test


HQA / DQA DL Tool


VersionDateComment

V 3.2.5.002



 

goofy.liu 

  Project: AP6800

  • - Tamper Test
         - Tamper Enable, 90-02, 90-13
         - Tamper Test, C7-3A, Get DRS
  •   - Button Cell Voltage Range Correction
         Native: 3.0V ~ 3.4V, incorrect
         New:    2.85V~ 3.15V, based on 3V +- 5%

Reference: NEO3 command list, K81 part

/wiki/spaces/NEO3/pages/63081142