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Platform NEO 2.0 + K81
Lab Debug Tool: USB-IF, EMI
Projects: Vendi Pro (Fox Tail); Spectrum Pro II;
| Version | Comment | Approved by... |
|---|---|---|
V 1.00.008 | ||
1.Engineer Mode ICC Loop test Update. When Loop Item checked, only get ATR command being issued in a infinite loop until stop. 2. Supported Products List: VP3310, VP5300, VP6300, VP8800 | ||
V 1.00.007 | ||
02 goofy.liu Platform: NEO 2.0 1.[Tamper Test] Added Ability to detect UUT rebooting over USB Device check routine. Note: Must set up UUT (a) with RS232 & USB-HID Connectivities on the same time. (b) Use RS232 Connection.
2.Add skip 04-09 behavior in [Connecting] [ICC] [MSR] | ||
1.Update Loop Test Flow. Enable [Cancel] @ Waiting Interval. 2.Add Skip Internal Loop @ HW Area. This feature skips internel loop while loop test check box 'ON'. | ||
V 1.00.006 | ||
Verified FW: VP6300 FW v1.00.000.0054.S | ||
2017 Dec 13 Released, goofy_liu 1.Fixed LEDs+Buzzer Test issue. 2.Test MSR Interface in UMFG mode. 3.Right-Clicking FWInfo to pop-up Voltage Level Selection Menu. Area 1, Right Clicking → Area 2, Pop-up Menu.
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V 1.00.005 | ||
1.Update for Tamper Display w/ Date-Time if UUT being Tampered. 2.Default Loop Item Duration 1500 ms --> 100000 ms 3.ICC Test @ VP5300 @VP6300, Skip Front Sensor IN/OUT Test Steps | ||
V1.00.005-C02, 1.Fixed ICC Test, Test Scenario Problem @ VP6300 2.Fixed , Tamper Test, Test Scenario | ||
V1.00.005-C01, 1.Update Tamper Test Scenario. More Repower Times. ---<UMFG ↔ SMFG Notes>-- 1.Please use USDK-PKI to perform UMFG + SMFG function. b.or I used USDK_PKI version :USDK_PKI_10_17.7z Operation Note : 2. 2.a. UMFG → SMFG , Steps Sequence : 1-2-3-4-5, Check twin successfully message in right-most message window.
2.b SMFG → UMFG Steps Sequence: 1-2-3, Check Master Reset Command Done message.
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V 1.00.004 | ||
V1.00.004-C02, 2017 Nov 16 Project:VP5300 1.For Maguel Caro MSR Repeat Test. | ||
V1.00.003-C04, 2017 Oct 24 Project:VP5300 1.Update ICC Test Add Front-Switch + Card-Seat Status Check before Get ATR. 2.Update SAM Test Add Get SAM ATR Error-Retry Mechanism (3 times up) since Tri-Mag 4 talks slower response. | ||
V 1.00.003 | ||
2017 Oct 17 1.MSR Test Function Ready 2.RFID Test Function Ready 3.ICC Test Function Ready 4.LED+Buzzer Function Ready | ||
V1.00.003-C03, 2017 Oct 13
*changed parameter .. old : Turn On Stop Mode (Byte 1, Byte 1) new : Turn On Stop Mode (Byte 1, Byte 0) - 2017 Oct 12 updated *remove confirm dialog box Sleep Mode - *remove confirm dialog box
CL RFID old: Poll for token, new: Loopback start / stop
a) Set RTC --> b) USB-HID Test, Ask User Re-Power on again --> c) Check RTC If Failed in Step (c), then show "Please check Battery Status." | ||
2017 Oct 06 updated
Sometimes Rebooting after Status Get. FW Issue. ========================================= V1.00.003-C02, 2017 Oct 06
L100 Ping --> Ethernet Ping --> Poll For Token
Pop-up Menu Selection of EMV L1 - Voltage Level Selection. Group 1 + 2
RFID Panel LED light on in order(L->R).
USB Conn: ICC Test - Front Switch Doesn't work.
USB Conn: RFID Test - 2C-02 Doesn't work.
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--<ToDo>-- 2017 Sept 28 updated
========================================= V1.00.003-C01, 2017 Sept 28
Contact, Sleep Mode, Stop Mode, and Ethernet. | ||
V 1.00.002 | ||
1.Add Tamper List Display (Dialog Box) 2.For ME Tamper Test. a.如果要循環連續測試, 請把 項目3.選起, TS 會自動連續測. Please check *Single Loop Test" (part 3) for loop test purpose. b.對話視窗 5. 在測試過程會持續更新. 直到項目 3 取消選取或測試成功 Tamper List Dialog box (part 5). Loop Test Running until un-check part 3. 紅色背景or字 = Tamper Broken, 綠色背景or字 = Tamper Good Red Background or String = Tamper Broken, Green Background or String = Tamper Good | ||
V 1.00.001 | ||
2017 July 17 Released,for ESD version
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Under construction... | ||
| 2017 July 05 | |
| 2017 July 04 |
Platform AR 3.0.0
Lab Debug Tool: USB-IF, EMI
Projects: PISCES
| Version | Comment | Approved by |
|---|---|---|
V 1.00.001 | ||
| For USB-IF, EMI Test. | 2017 Feb 15 |