000 - Wiki, Tips, User Guide, Q & A, and Notes

Owned by goofy.liu
Last updated: Mar 08, 2022
5 min read

Description

To make Developers easier to find what they want regarding to Test Technologies, methedology.


NEO  Test Software Additional Required Tools

ItemComment

01- AdminK_PID_Setup.zip

Platform: NEO 1.x

1.Created by cloudchang , Allie_Lee (Deactivated)

2.Admin Key Database, installed it before Performing Admin Key Injection.

3.After Production, the database info will be uploaded to Cypress RKI Server.

4.Who use ? PE / NEO TS Developer / Others

5.Arena Release

https://app.bom.com/files/detail-summary?file_master_id=1235188980&file_id=1746878938&

6.Also see

Test Software Root#CurrentProjectInformationListExampleinAdminKeyDatabase

 goofy.liu

Updated for LCL-KEK Admin Key KSN renew definition.

  • 1.Please check out the e-mail.

RE IDVP-12P-N.msg

  • 2.Where to check the LID/PID from the NEO1x TS...

They are kept in the system registry pool.

02 - Database file (.mdb) problem

Platform: NEO 1.x, AdminK_PID_Setup.zip

 goofy.liu

1.Root case :

Sometimes C:\AdminK\*.mdb file has Access (I/O) problem. It might be locked by other program.

It makes TS fail to inject Admin Key.

2.Solution:

Step 01 - Remove Old AdminK_PID_Setup,

Step 02 - Re-install it.

03 - MCL TQM Request

 goofy.liu

Master Card asks to test new Criteria during Card Reader Production.

1.This is the TQM request e-mail.

FW TQM Audit Schedule--Manufacturing Taiwan.msg

1.1 RFID Test. the couple of inspected distances between PCD and PICC are 0cm and 4cm.

1.2 Contact Test. Activation (Power ON) → Reset → Information Exchange (APDU Exchange) → Deactivation (Power OFF)

Here is an representative test example.

ICC_Information_Exchange_FW VP3300 Android SDK.msg


04 - TQM - ICC Parts

 goofy.liu

Special Note01 for IDTech ICC Cards.

  1. Type 01 - CLXSU004J4/T=0

    1.A : ICC Test Compatible Platform w/ APDUs operation.
    (tick)NEO 1.0, legacy product
    (tick)NEO 2.0

  2. Type 02 - CLXSU064KCS/T=0ED

    2.A : Compatible Platform.
    (tick)(warning)NEO 1.0, legacy product.
    (tick)NEO 2.0
    Use Type 02 in NEO 1.0 for Reset PIN soldering issues.
  3. NEO1.0 ICC Test Scenario
    old: Get ATR (ICC Card - Type 02) → Remove it
    → Done
    new: Get ATR (ICC Card - Type 01) → Execute Multiple APDUs → Remove Type 01
    →  Get ATR(Type 02) → Execute a APDU and return V2 Sts 0x0A
    →  Done.
  4. Steps for Data PIN Test of TQM(MCL) ICC Criteria.

    1.    插入卡片(ICC)

    2.    Enable pass through 2C-01+01

    3.    ICC power on (2C-12, Get ATR)

    4.    Send APDU : 2C-13 + 20 + APDU

    00A40000023040 , Select

    002000800E73616D706C6570617373776F7264 , Verify -->

    00D60000084142434445464748 -->

    00B0000008

    5. ICC Power OFF : 2C-18 + 20



Tips

Note
Comment

01-How to Enable Stress Test

Platform: NEO 1.0


02-How to Quickly Reset

Platform: NEO 1.0

Cmd: 04-F0



03- TS Configuration 001

Set Privilege "Run As Administrator"



04- Bluetooth Test Method

Platform: NEO 1.0,

Product: VP3300 BLE


Reader - BTPay-Mini, Blue-tooth Module Vendor - Enzytek

Enzytek Contact Info FW SPS service demo source code for both Android and iOS to IDtech Tony.msg

Relative RE BTPay Mini Test Mobile Required Test Instruction Information - V02.msg mail.


Last Updated : 2016 Dec 16. goofy_liu@idtechproducts.com.tw

05- "Run As Administrator"

How to make InnoSetup package be able to

perform "Run As Administrator" privilege ?


[Setup]

PrivilegesRequired=admin

[Run]

Filename: "{app}\{#ApplicationExeName}"; Flags: postinstall  nowait  runascurrentuser

06- Admin Key Injection, Stand alone

Platform: NEO 1.0

 

 goofy.liu

Exe Path: "Engineer Mode" → Connect → Production Mode → NEO Area 2 → Click "Admin Key Set/Get" Button.

07 - Software Release Verification Tool (SHA-512/1024)


Please visit another page.

https://atlassian.idtechproducts.com/confluence/pages/viewpage.action?spaceKey=TWRD&title=SW_Tools#SW_Tools-SQASoftwareApprovalTool.

08 - Must have IDG Commands in Tampered SRED Device.

 

Non-blocking (*Must have*) IDG Cmd @ SRED Tampered Device.

  • 1.Ping 18-01
  • 2.Module Version Serials : 09-XX (-01,-02,-03,-14,-20)
  • 3.Version Information : 29-XX (-00,-04,-06,-07,-08,-09,-17)
  • 4.Serial Number : Get(12-01)
  • 5.Passthough ON/OFF : 2C-01
  • 6.UMFG : 90-XX , (-07,-00,-01,*-02*,...)
  • 7.SMFG : Master Reset 91-00, Allowed Tampered Device could be reset back to UMFG mode.

         Secure Task - Start : 12-00

  • 8.Tampered Information Commands

  C7-3D;   C7-37

09 - TransArmor Certificates Checking Rules

 

  • 1.Platform: NEO 2.0
  • 2.Get TA Certificate IDG Command: C7-54 + x00 (Index) ~ x02
  • 3.TransArmor_C7-54_Resp_Cert_Format.txt <= check this C7-54 response analysis information for your reference.

Being used a lot of TLVs as its structure fields.

  • 4. The following are examples of this response key words

--[Trans Armor CA Cert List : SPTP2-988-33--2C]--

TA Root CA Cert: TACA

TA Interm CA Cert: TACAP1

--[Trans Armor CA Cert List : SPTP2-988-33--2CD]--

TA Root CA Cert: TACA

TA Interm CA Cert: TACAT1

  • 5. NEO 2.0 Test Software programming Guide.

TestTM800_FWInfoMISCs_009_NEO20_CertificateInstalled_Chk()


10 - Design Note 001.Test Software

 

  • 1.if TS needs DUT performing re-connection behavior, please use..

way01 (priority 01) - Auto Reboot (App Mode → BL Mode → App Mode)

way02 (priority 02) - USB Un-plug → USB Plug In


2.Quick typing keywords (1), to get filtered part number(s) sublist (2)

(1) = typing / input keywords

(2) = auto filtered part number sub-list


3. Objective: Non-battery power, host power-consumed DUT QC mode RTC Test notes.
step 01 - Sync RTC  (normally in 2nd test item)

step 02 - other test items, please NOT design re-plug in behaviors during these items specially in Non-Battery Power type DUT verification. Using "Auto Rebooting" method be instead of "Re-Plug IN" behavior would be preferred.

step 03 - Check RTC .

11.(C#) Visual Studio (Run As Admin Mode) Drag and Drop Disabled issue

 

goofy.liu

The answer is that "Starting from Windows Vista because of User Interface Privilege Isolation you cannot drag and drop from an application running at lower integrity level to an application which runs on a higher level."


Ref URL:

1.https://stackoverflow.com/questions/21651580/drag-and-drop-not-working-in-c-sharp

2.

https://stackoverflow.com/questions/17416765/drag-and-drop-event-can-not-be-fired-when-running-visual-studio-in-administrator


12. Battery Name 中文 ↔ English Translation

 

Battery / Batteries 電池、蓄電池; Rechargeable Battery 充電電池;

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  • Nickel Hydrogen Battery, Ni-MH Cylindrical, Rechargeable Batteries  鎳氫電池 Ni-Mh ⽬前最⾼容量約是2400mAh 左右

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  • Ni-MH Button Cells 鈕扣型鎳氫電池;
  • Nickel Cadmium Battery 鎳鎘電池 Ni-Cd, 鎳鎘電池是以氫氧化鎳為 活性材料
  • Cadmium Cell 鎘電池

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  • Li-ion Battery 鋰電池 Li-lon, 以鋰鈷氧化物、鋰鎳氧化物、鋰錳氧化物等為活性材料. 重量⽐鎳氫電池輕.

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  • Lithium ion Battery 鋰離⼦電池
  • Polymer Lithium Battery ⾼分⼦鋰電池, 以⾼分⼦電解質取代液態 鋰離⼦電池
  • Lithium iron Phosphate 鋰鐵電池, 磷酸鋰鐵電池

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  • Li-Polymer 鋰聚合物電池
  • Li-ion Button Battery 鈕扣型鋰離⼦電池
  • Secondary Lithium Battery ⼆次鋰電池
  • Dry Battery (dry cell) 乾電池
  • Carbon zinc batteries 鋅錳乾電池/碳鋅電池, 陰極以碳棒周圍以⼆氧化 錳為活性物質

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  • Alkaline Battery (Alkaline Cell) 鹼性電池

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Lithium Manganese Dioxide Cell ⼆氧化錳電池

Alkaline-manganese Dioxide-zinc Cell 鹼性⼆氧化錳/鋅電池, 以鋅和⼆氧化錳之間的化學反應產⽣電能

Zinc-mercury batteries, Zinc Mercury-Oxide Battery 鋅汞電池

Mercury Batteries ⽔銀電池

Solar Cell 太陽能電池

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Lead Acid Battery 鉛酸電池, 多為⼀般⾞⽤電瓶

Valve-strip type Lead-Acid Battery 閥條式鉛酸電池

Fuel Cell 燃料電池, 固態氧化物作爲電解質，轉換效率⾼

Hydrogen Oxygen Fuel  Cell 氫氧燃料電池

Solid Oxide Fuel Cells 固態氧化物燃料電池, 屬於⾼溫型電池.

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