Firmware
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| title | Neo 2 |
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Neo 2 Firmware release table
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Release FW for PCI testing
Revert "Buzzer disable"
Remove hardcode SN
Disable BLE production test download FW
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Release FW for FCC testing
Update hareware config for DVT2 device
Buzzer disabled
Add support of BLE production test mode
Correct the path \bl_release\srec_make\bl\v2.03
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For ME test tamper and FCC in DVT2.
Default return the 335Z000010.
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Disable tamper and self test for power management test.
Fix DVT2 current too high when enter sleep mode. (DVT2 C)
Support Winbond External Flash.
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Disable tamper and self test for power management test .
Use male connector charge phone 500mA when detect female cc pin is 500mA
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Disable USB switch for config B. (DVT B)
Fix can't enter standby mode for BT version.
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Release for L2 test
(enable PP log and utc time test)
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Release for L2 test
(Master and Interac)
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- Bootloader update to v2.03
- Release for L2 test
- Contactless wakeup mode disabled
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Add support of contactless wakeup mode
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Release for EVT2
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Tools
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| title | Bootloader |
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| title | Docklight Script |
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| title | Tool |
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| title | SDK Demo |
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Windows
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Android
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iOS
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| title | Event Log |
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Documents
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| title | Document |
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