| Table of Contents |
|---|
Test Process Flow in Manufactures.
Products List
| Product | Year | TS | Comment |
|---|---|---|---|
AP6800 | 2022 | TS200, K81 Only |
Android : A300 NEO3x : K81 |
K81 Functions Docklight,
powered by Paul Zhang
| Version | Date | Comment |
|---|---|---|
| K81 Functional Test Script. Platform: NEO2x | |
Environment Setup |
Simple User Guide
| Item | Comment |
|---|---|
UI |
|
Mode 1 | Press "Start" Button to Start Test Automatically. |
Mode 2 | Single Test Item Test. Just Click test item button as you like. |
TS200 DL Link, AP6800, For K81 Only
| Version | Date | Comment | SQA |
|---|---|---|---|
V 3.2.1.2 | |||
| 1.Update Tamper Enable current: 90-02, timeout: 15 secs new: 90-13 + 16000F, tout: 120 secs | ||
| 1.Fixed FWInfo Item @ Board Level Test Production ID 0x7 --> 0x5
2.Fixed K81 LED Test Items Issue @ Board Level Test Updated IDG commands 90-13 serials. 3. UMFG Tamper Enable Timeout updated native: 40000 ms, 40 seconds new: 120000 ms,120 seconds | ||
| 1.Fixed FWInfo Item @ Assembly Level Test 3.Fixed Printer Test Items Issue@ Assembly Level Test ==[Dev Note]== FW @Casper Provided the corrected Commands. | ||
V 3.2.1.1 | |||
|
Native: 3.0V ~ 3.4V, incorrect New: 2.85V~ 3.15V, based on 3V +- 5% | ||
|
Note: There is the Arduino Command Gap between AP6800 and NEO3x AP6800 = "VDC_IN = 8.83\r\n"
|
HQA / DQA DL Tool
| Version | Date | Comment |
|---|---|---|
V 3.2.5.002 | ||
| Project: AP6800
|