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JFlash Project (security): NXP_MK82FN256xxx15.jflash
VP3310 FW File Table
Date Posted | Version | Release Package | Document Version | Release Note |
|---|---|---|---|---|
| 2018/11/02 | VP3310 FW v1.00.000.0229.S Test CLL2 Kernel | VP3310 FW v1.00.000.0229.S Test.7z | Release for contactless level 2 test | |
| 2018/10/29 | VP3310 FW v1.00.000.0226.S Test CLL2 Kernel | NEO 2 IDG_Rev 70.doc | Tamper disabled Release for contactless level 2 test | |
| 2018/10/25 | VP3310 FW v1.00.000.0223.S Test beta 1 p2 | VP3310 FW v1.00.000.0223.S Test beta 1 p2.7z | Release for trial run 3 | |
| 2018/09/11 | VP3310 FW v1.00.000.0199 Test | VP3310 FW v1.00.000.0199.S Test without tamper.7z | ||
| 2018/09/10 | VP3310 FW v1.00.000.0199 Test | VP3310 FW v1.00.000.0199.S Test.7z | Tamper enabled | |
| 2018/08/28 | VP3310 FW v1.00.000.0192 Test | VP3310 FW v1.00.000.0192.S Test.7z | For v2 board second trial run | |
| 2018/08/22 | VP3310 FW v1.00.000.0182 Test | VP3310 FW v1.00.000.0182.S Test.7z | For v2 board trial run | |
| 2018/08/03 | VP3310 FW v1.00.000.0179 Test CLL2 Kernel | VP3310 FW v1.00.000.0179.S Test.7z | Function verified:
| |
| 2018/07/30 | VP3310 FW v1.00.000.0176 Test CLL2 Kernel | NEO 2 IDG_Rev 65.doc | Tamper enabled | |
| 2018/05/25 | VP3310 FW v1.00.001.0134 Test CLL2 Kernel | NEO 2 IDG_Rev 53.doc | First edition | |